|
Resolution: standard / high Figure 4.
Gene-expression dependent variation in TE intronic abundance. Gene expression levels
were derived from microarray data. (a) Lowess fit (solid line) and probability intervals (hatched lines) of TEna versus gene expression level (log transformed values) for the six TE families. (b) Lowess fit (solid line) and probability intervals (hatched lines) of intronic to intergenic
relative TE frequency difference (see text) versus gene expression level (log transformed
values).
Sironi et al. Genome Biology 2006 7:R120 doi:10.1186/gb-2006-7-12-r120 |